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A reaction-layer mechanism for the delayed failure of micron-scale polycrystalline silicon structural films subjected to high-cycle fatigue loading
Christopher L. Muhlstein, E.A. Stach, Robert O. Ritchie (2002). A reaction-layer mechanism for the delayed failure of micron-scale polycrystalline silicon structural films subjected to high-cycle fatigue loading. Acta Materialia, 50(14), pp. 3579-3595, DOI: 10.1016/s1359-6454(02)00158-1.
Article306 days agoHigh-cycle fatigue of single-crystal silicon thin films
Christopher L. Muhlstein, Stuart B. Brown, Robert O. Ritchie (2001). High-cycle fatigue of single-crystal silicon thin films. Journal of Microelectromechanical Systems, 10(4), pp. 593-600, DOI: 10.1109/84.967383.
Article267 days agoHigh-cycle fatigue and durability of polycrystalline silicon thin films in ambient air
Christopher L. Muhlstein, Stuart B. Brown, Robert O. Ritchie (2001). High-cycle fatigue and durability of polycrystalline silicon thin films in ambient air. Sensors and Actuators A Physical, 94(3), pp. 177-188, DOI: 10.1016/s0924-4247(01)00709-9.
Article267 days agoMechanisms for Fatigue of Micron‐Scale Silicon Structural Films
D. H. Alsem, Olivier N. Pierron, E.A. Stach, Christopher L. Muhlstein, Robert O. Ritchie (2007). Mechanisms for Fatigue of Micron‐Scale Silicon Structural Films. Advanced Engineering Materials, 9(1-2), pp. 15-30, DOI: 10.1002/adem.200600269.
Article267 days agoMechanism of fatigue in micron-scale films of polycrystalline silicon for microelectromechanical systems
Christopher L. Muhlstein, E.A. Stach, Robert O. Ritchie (2002). Mechanism of fatigue in micron-scale films of polycrystalline silicon for microelectromechanical systems. Applied Physics Letters, 80(9), pp. 1532-1534, DOI: 10.1063/1.1455142.
Article267 days ago