0 Datasets
0 Files
Get instant academic access to this publication’s datasets.
Yes. After verification, you can browse and download datasets at no cost. Some premium assets may require author approval.
Files are stored on encrypted storage. Access is restricted to verified users and all downloads are logged.
Yes, message the author after sign-up to request supplementary files or replication code.
Join 50,000+ researchers worldwide. Get instant access to peer-reviewed datasets, advanced analytics, and global collaboration tools.
✓ Immediate verification • ✓ Free institutional access • ✓ Global collaborationJoin our academic network to download verified datasets and collaborate with researchers worldwide.
Get Free AccessWhen subjected to alternating stresses, most materials degrade, e.g., suffer premature failure, due to a phenomenon known as fatigue. It is generally accepted that in brittle materials, such as ceramics, fatigue can only take place in toughened solids, i.e., premature fatigue failure would not be expected in materials such as single crystal silicon. The results of this study, however, appear to be at odds with the current understanding of brittle material fatigue. Twelve thin-film (/spl sim/20 /spl mu/m thick) single crystal silicon specimens were tested to failure in a controlled air environment (30/spl plusmn/0.1/spl deg/C, 50/spl plusmn/2% relative humidity). Damage accumulation and failure of the notched cantilever beams were monitored electrically during the "fatigue life" test. Specimen lives ranged from about 10 s to 48 days, or 1/spl times/106 to 1/spl times/1011 cycles before failure over stress amplitudes ranging from approximately 4 to 10 GPa. A variety of mechanisms are discussed in light of the fatigue life data and fracture surface evaluation.
Christopher L. Muhlstein, Stuart B. Brown, Robert O. Ritchie (2001). High-cycle fatigue of single-crystal silicon thin films. Journal of Microelectromechanical Systems, 10(4), pp. 593-600, DOI: 10.1109/84.967383.
Datasets shared by verified academics with rich metadata and previews.
Authors choose access levels; downloads are logged for transparency.
Students and faculty get instant access after verification.
Type
Article
Year
2001
Authors
3
Datasets
0
Total Files
0
Language
English
Journal
Journal of Microelectromechanical Systems
DOI
10.1109/84.967383
Access datasets from 50,000+ researchers worldwide with institutional verification.
Get Free Access