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Characterization of various aluminium oxide layers by means of spectroscopic ellipsometry
J. De Laet, Jan Vanhellemont, Herman Terryn, J. Vereecken (1992). Characterization of various aluminium oxide layers by means of spectroscopic ellipsometry. Applied Physics A Solids and Surface, 54(1), pp. 72-78, DOI: 10.1007/bf00348134.
Article279 days agoSpectroscopic ellipsometry characterization of anodic films on aluminium correlated with transmission electron microscopy and Auger electron spectroscopy
J. De Laet, Herman Terryn, J. Vereecken, Jan Vanhellemont (1992). Spectroscopic ellipsometry characterization of anodic films on aluminium correlated with transmission electron microscopy and Auger electron spectroscopy. Surface and Interface Analysis, 19(1-12), pp. 445-449, DOI: 10.1002/sia.740190183.
Article279 days agoCharacterization of different conversion coatings on aluminium with spectroscopic ellipsometry
J. De Laet, Jan Vanhellemont, Herman Terryn, J. Vereecken (1993). Characterization of different conversion coatings on aluminium with spectroscopic ellipsometry. Thin Solid Films, 233(1-2), pp. 58-62, DOI: 10.1016/0040-6090(93)90061-s.
Article279 days ago