—
We haven't found any bio for you yet.
Loading links...
Loading publications…
J. De Laet, Jan Vanhellemont, Herman Terryn, J. Vereecken (1992). Characterization of various aluminium oxide layers by means of spectroscopic ellipsometry. Applied Physics A Solids and Surface, 54(1), pp. 72-78, DOI: 10.1007/bf00348134.
