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Ming Zhu, P. Chen, Ricky K.Y. Fu, W.L. Liu, Chih-Huang Lin, Paul Kim Ho Chu (2004). Structural and electrical properties of Al/sub 2/O/sub 3/-ZrO/sub 2/ gate dielectrics on silicon-on-insulator. , DOI: https://doi.org/10.1109/iwjt.2004.1306859.
