Synchrotron X-ray micro-tomography at the Advanced Light Source: Developments in high-temperature in-situ mechanical testing
Harold Barnard, Alastair A. MacDowell, Dilworth Y. Parkinson, Pratiti Mandal, Michael W. Czabaj, Yan Gao, Emmanuel Maillet, Basil Blank, Natalie Larson, Robert O. Ritchie, Bernd Gludovatz, Claire Acevedo, Dong Liu (2017). Synchrotron X-ray micro-tomography at the Advanced Light Source: Developments in high-temperature in-situ mechanical testing. Journal of Physics Conference Series, 849, pp. 012043-012043, DOI: 10.1088/1742-6596/849/1/012043.
