Raw Data Library
About
Aims and ScopeAdvisory Board Members
More
Who We Are?
User Guide
Green Science
​
​
EN
Sign inGet started
​
​

About
Aims and ScopeAdvisory Board Members
More
Who We Are?
User GuideGreen Science

Language

Sign inGet started
RDL logo

Verified research datasets. Instant access. Built for collaboration.

Navigation

About

Aims and Scope

Advisory Board Members

More

Who We Are?

Add Raw Data

User Guide

Legal

Privacy Policy

Terms of Service

Support

Got an issue? Email us directly.

Email: info@rawdatalibrary.netOpen Mail App
​
​

© 2026 Raw Data Library. All rights reserved.
PrivacyTerms
  1. Raw Data Library
  2. /
  3. Publications
  4. /
  5. Synchrotron X-ray micro-tomography at the Advanced Light Source: Developments in high-temperature in-situ mechanical testing

Verified authors • Institutional access • DOI aware
50,000+ researchers120,000+ datasets90% satisfaction
Article
English
2017

Synchrotron X-ray micro-tomography at the Advanced Light Source: Developments in high-temperature in-situ mechanical testing

0 Datasets

0 Files

English
2017
Journal of Physics Conference Series
Vol 849
DOI: 10.1088/1742-6596/849/1/012043

Get instant academic access to this publication’s datasets.

Create free accountHow it works

Frequently asked questions

Is access really free for academics and students?

Yes. After verification, you can browse and download datasets at no cost. Some premium assets may require author approval.

How is my data protected?

Files are stored on encrypted storage. Access is restricted to verified users and all downloads are logged.

Can I request additional materials?

Yes, message the author after sign-up to request supplementary files or replication code.

Advance your research today

Join 50,000+ researchers worldwide. Get instant access to peer-reviewed datasets, advanced analytics, and global collaboration tools.

Get free academic accessLearn more
✓ Immediate verification • ✓ Free institutional access • ✓ Global collaboration
Access Research Data

Join our academic network to download verified datasets and collaborate with researchers worldwide.

Get Free Access
Institutional SSO
Secure
This PDF is not available in different languages.
No localized PDFs are currently available.
Robert O. Ritchie
Robert O. Ritchie

University of California, Berkeley

Verified
Harold Barnard
Alastair A. MacDowell
Dilworth Y. Parkinson
+10 more

Abstract

At the Advanced Light Source (ALS), Beamline 8.3.2 performs hard X-ray micro-tomography under conditions of high temperature, pressure, mechanical loading, and other realistic conditions using environmental test cells. With scan times of 10s–100s of seconds, the microstructural evolution of materials can be directly observed over multiple time steps spanning prescribed changes in the sample environment. This capability enables in-situ quasi-static mechanical testing of materials. We present an overview of our in-situ mechanical testing capabilities and recent hardware developments that enable flexural testing at high temperature and in combination with acoustic emission analysis.

How to cite this publication

Harold Barnard, Alastair A. MacDowell, Dilworth Y. Parkinson, Pratiti Mandal, Michael W. Czabaj, Yan Gao, Emmanuel Maillet, Basil Blank, Natalie Larson, Robert O. Ritchie, Bernd Gludovatz, Claire Acevedo, Dong Liu (2017). Synchrotron X-ray micro-tomography at the Advanced Light Source: Developments in high-temperature in-situ mechanical testing. Journal of Physics Conference Series, 849, pp. 012043-012043, DOI: 10.1088/1742-6596/849/1/012043.

Related publications

Why join Raw Data Library?

Quality

Datasets shared by verified academics with rich metadata and previews.

Control

Authors choose access levels; downloads are logged for transparency.

Free for Academia

Students and faculty get instant access after verification.

Publication Details

Type

Article

Year

2017

Authors

13

Datasets

0

Total Files

0

Language

English

Journal

Journal of Physics Conference Series

DOI

10.1088/1742-6596/849/1/012043

Join Research Community

Access datasets from 50,000+ researchers worldwide with institutional verification.

Get Free Access