D. R. Khanal

Dopant profiling and surface analysis of silicon nanowires using capacitance–voltage measurements

Erik C. Garnett, Yu‐Chih Tseng, D. R. Khanal, Junqiao Wu, Jeffrey Bokor, Peidong Yang (2009). Dopant profiling and surface analysis of silicon nanowires using capacitance–voltage measurements. , 4(5), DOI: https://doi.org/10.1038/nnano.2009.43.