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Alexis Franquet, J. De Laet, T. Schram, Herman Terryn, V. Subramanian, W.J. van Ooij, J. Vereecken (2001). Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry. Thin Solid Films, 384(1), pp. 37-45, DOI: 10.1016/s0040-6090(00)01805-8.
