Characterization of Silicon Nitride/Lanthanide-Oxide Interfaces at the Atomic Scale by Scanning Transmission Electron Microscopy and Density Functional Theory
Juan Carlos Idrobo, Alexander Ziegler, Michael K. Cinibulk, Christian Kisielowski, Robert O. Ritchie, Nigel D. Browning, Serdar Öğüt (2005). Characterization of Silicon Nitride/Lanthanide-Oxide Interfaces at the Atomic Scale by Scanning Transmission Electron Microscopy and Density Functional Theory. Bulletin of the American Physical Society
