J. Snauwaert

Study of organic self-assembling monolayers on aluminium oxides by means of Atomic Force Microscopy (AFM) and X-ray Photoelectron Spectroscopy (XPS)

Tom Hauffman, Orlin Blajiev, J. Snauwaert, Chris Van Haesendonck, Annick Hubin, Herman Terryn (2007). Study of organic self-assembling monolayers on aluminium oxides by means of Atomic Force Microscopy (AFM) and X-ray Photoelectron Spectroscopy (XPS).