Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy
Osamu Terasaki, Haesung Cho, Minhyung Cho, HuYoung Jeong, Shunsuke Asahina, Yusuke Sakuda, Mituo Suga, Masato Kudo, Takeshi Nokuo, Zheng Liu, Sam M. Stevens, Michael W. Anderson, DianaCarolina GaleanoNunez, Ferdi Schüth, Tomas Kjellman, Viveka Alfredsson, Lu Han, Shunai Che, Hexiang Deng, Omar M Yaghi, Kanghee Cho, Ryong Ryoo (2013). Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy. , 48
