<b>In Situ Characterizations of Nanostructured SnO</b><sub><i>x</i></sub><b>/Pt(111) Surfaces Using Ambient-Pressure XPS (APXPS) and High-Pressure Scanning Tunneling Microscopy (HPSTM)</b>
Stephanus Axnanda, Zhongwei Zhu, Wei-Ping Zhou, Baohua Mao, Rui Chang, Sana Rani, Ethan J Crumlin, Gabor Somorjai, Zhi Liu (2014). <b>In Situ Characterizations of Nanostructured SnO</b><sub><i>x</i></sub><b>/Pt(111) Surfaces Using Ambient-Pressure XPS (APXPS) and High-Pressure Scanning Tunneling Microscopy (HPSTM)</b>. , 118(4), DOI: https://doi.org/10.1021/jp409272j.
