Using the Electron Microscope to Explore Reliability in Microelectromechanical Systems and Nanostructured Materials
Eric A. Stach, V. Gopal, Miao Jin, Daan Hein Alsem, Mark J. Williamson, Andrew M. Minor, Velimir Radmilović, Christopher L. Muhlstein, J.W. Morris, Robert O. Ritchie (2004). Using the Electron Microscope to Explore Reliability in Microelectromechanical Systems and Nanostructured Materials. Microscopy and Microanalysis, 10(S02), pp. 354-355, DOI: 10.1017/s1431927604886240.
