Recent progress in scanning electron microscopy for the characterization of fine structural details of nano materials
Mitsuo Suga, Shunsuke Asahina, Yusuke Sakuda, H. Kazumori, Hidetoshi Nishiyama, Takeshi Nokuo, Viveka Alfredsson, Tomas Kjellman, Sam M. Stevens, Hae Sung Cho, Minhyung Cho, Lu Han, Shunai Che, Michael W. Anderson, Ferdi Schüth, Hexiang Deng, Omar M Yaghi, Zheng Liu, Hu Young Jeong, Andreas Stein, Kazuyuki Sakamoto, Ryong Ryoo, Osamu Terasaki (2014). Recent progress in scanning electron microscopy for the characterization of fine structural details of nano materials. , 42(1-2), DOI: https://doi.org/10.1016/j.progsolidstchem.2014.02.001.
