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Daan Hein Alsem, R. Timmerman, Brad Boyce, E.A. Stach, J. Th. M. De Hosson, Robert O. Ritchie (2007). Very high-cycle fatigue failure in micron-scale polycrystalline silicon films: Effects of environment and surface oxide thickness. Journal of Applied Physics, 101(1), DOI: 10.1063/1.2403841.
