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Christopher L. Muhlstein, E.A. Stach, Robert O. Ritchie (2002). A reaction-layer mechanism for the delayed failure of micron-scale polycrystalline silicon structural films subjected to high-cycle fatigue loading. Acta Materialia, 50(14), pp. 3579-3595, DOI: 10.1016/s1359-6454(02)00158-1.
