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Peida Zhao, Matin Amani, Der‐Hsien Lien, Geun Ho Ahn, Daisuke Kiriya, James P. Mastandrea, Joel W. Ager, Eli Yablonovitch, D. C. Chrzan, Ali Javey (2017). Measuring the Edge Recombination Velocity of Monolayer Semiconductors. , 17(9), DOI: https://doi.org/10.1021/acs.nanolett.7b01770.
