Beiwen Chen

Need Valuation Measure

Beiwen Chen, Maarten Vansteenkiste, Wim Beyers, Liesbet Boone, Edward L. Deci, Jolene van der Kaap–Deeder, Bart Duriez, Willy Lens, Lennia Matos, Athanasios Mouratidis, Richard M. Ryan, Kennon M. Sheldon, Bart Soenens, Stijn Van Petegem, Joke VerstuyfNeed Valuation Measure. , DOI: https://doi.org/10.1037/t55633-000.