Atomic Resolution Transmission Electron Microscopy of the Intergranular Structure of a Y<sub>2</sub>O<sub>3</sub>‐Containing Silicon Nitride Ceramic
Alexander Ziegler, C. Kisielowski, Michael J. Hoffmann, Robert O. Ritchie (2003). Atomic Resolution Transmission Electron Microscopy of the Intergranular Structure of a Y<sub>2</sub>O<sub>3</sub>‐Containing Silicon Nitride Ceramic. Journal of the American Ceramic Society, 86(10), pp. 1777-1785, DOI: 10.1111/j.1151-2916.2003.tb03554.x.
