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The last 5 uploaded publications
The Utility of <i>R</i>‐Curves for Understanding Fracture Toughness‐Strength Relations in Bridging Ceramics
Jamie J. Kruzic, R. L. Satet, Michael J. Hoffmann, R. M. Cannon, Robert O. Ritchie (2008). The Utility of <i>R</i>‐Curves for Understanding Fracture Toughness‐Strength Relations in Bridging Ceramics. Journal of the American Ceramic Society, 91(6), pp. 1986-1994, DOI: 10.1111/j.1551-2916.2008.02380.x.
Article249 days agoAtomic Resolution Transmission Electron Microscopy of the Intergranular Structure of a Y<sub>2</sub>O<sub>3</sub>‐Containing Silicon Nitride Ceramic
Alexander Ziegler, C. Kisielowski, Michael J. Hoffmann, Robert O. Ritchie (2003). Atomic Resolution Transmission Electron Microscopy of the Intergranular Structure of a Y<sub>2</sub>O<sub>3</sub>‐Containing Silicon Nitride Ceramic. Journal of the American Ceramic Society, 86(10), pp. 1777-1785, DOI: 10.1111/j.1151-2916.2003.tb03554.x.
Article249 days agoInterfacial structure in silicon nitride sintered with lanthanide oxide
Christian Dwyer, Alexander Ziegler, N. Shibata, Graham B. Winkelman, R. L. Satet, Michael J. Hoffmann, Michael K. Cinibulk, P. F. Becher, G. S. Painter, Nigel D. Browning, D. J. H. Cockayne, Robert O. Ritchie, Stephen J. Pennycook (2006). Interfacial structure in silicon nitride sintered with lanthanide oxide. Journal of Materials Science, 41(14), pp. 4405-4412, DOI: 10.1007/s10853-006-0152-2.
Article249 days agoOn the Effect of Local Grain‐Boundary Chemistry on the Macroscopic Mechanical Properties of a High‐Purity Y<sub>2</sub>O<sub>3</sub>‐Al<sub>2</sub>O<sub>3</sub>‐Containing Silicon Nitride Ceramic: Role of Oxygen
Alexander Ziegler, J. M. McNaney, Michael J. Hoffmann, Robert O. Ritchie (2005). On the Effect of Local Grain‐Boundary Chemistry on the Macroscopic Mechanical Properties of a High‐Purity Y<sub>2</sub>O<sub>3</sub>‐Al<sub>2</sub>O<sub>3</sub>‐Containing Silicon Nitride Ceramic: Role of Oxygen. Journal of the American Ceramic Society, 88(7), pp. 1900-1908, DOI: 10.1111/j.1551-2916.2005.00412.x.
Article249 days agoAtomic resolution transmission electron microscopy of the intergranular structure of a Y{sub 2}O{sub 3}-silicon nitride ceramic
Alexander Ziegler, Christian Kisielowski, Michael J. Hoffmann, Robert O. Ritchie (2002). Atomic resolution transmission electron microscopy of the intergranular structure of a Y{sub 2}O{sub 3}-silicon nitride ceramic. OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
Article249 days ago