0 Datasets
0 Files
Get instant academic access to this publication’s datasets.
Yes. After verification, you can browse and download datasets at no cost. Some premium assets may require author approval.
Files are stored on encrypted storage. Access is restricted to verified users and all downloads are logged.
Yes, message the author after sign-up to request supplementary files or replication code.
Join 50,000+ researchers worldwide. Get instant access to peer-reviewed datasets, advanced analytics, and global collaboration tools.
✓ Immediate verification • ✓ Free institutional access • ✓ Global collaborationJoin our academic network to download verified datasets and collaborate with researchers worldwide.
Get Free AccessA stiff skin forms on surface areas of a flat polydimethylsiloxane (PDMS) upon exposure to focused ion beam (FIB) leading to ordered surface wrinkles. By controlling the FIB fluence and area of exposure of the PDMS, one can create a variety of patterns in the wavelengths in the micrometer to submicrometer range, from simple one-dimensional wrinkles to peculiar and complex hierarchical nested wrinkles. Examination of the chemical composition of the exposed PDMS reveals that the stiff skin resembles amorphous silica. Moreover, upon formation, the stiff skin tends to expand in the direction perpendicular to the direction of ion beam irradiation. The consequent mismatch strain between the stiff skin and the PDMS substrate buckles the skin, forming the wrinkle patterns. The induced strains in the stiff skin are estimated by measuring the surface length in the buckled state. Estimates of the thickness and stiffness of the stiffened surface layer are estimated by using the theory for buckled films on compliant substrates. The method provides an effective and inexpensive technique to create wrinkled hard skin patterns on surfaces of polymers for various applications.
Myoung‐Woon Moon, Sang Hoon Lee, Jeong‐Yun Sun, Kyu Hwan Oh, Ashkan Vaziri, John W. Hutchinson (2007). Wrinkled hard skins on polymers created by focused ion beam. Proceedings of the National Academy of Sciences, 104(4), pp. 1130-1133, DOI: 10.1073/pnas.0610654104.
Datasets shared by verified academics with rich metadata and previews.
Authors choose access levels; downloads are logged for transparency.
Students and faculty get instant access after verification.
Type
Article
Year
2007
Authors
6
Datasets
0
Total Files
0
Language
English
Journal
Proceedings of the National Academy of Sciences
DOI
10.1073/pnas.0610654104
Access datasets from 50,000+ researchers worldwide with institutional verification.
Get Free Access