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  5. Stress influence on band-edge luminescence properties of 4H-AlN

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Article
en
2009

Stress influence on band-edge luminescence properties of 4H-AlN

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en
2009
Vol 95 (12)
Vol. 95
DOI: 10.1063/1.3232218

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Paul Kim Ho Chu
Paul Kim Ho Chu

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Yingchun Cheng
X. L. Wu
Shuhua Li
+1 more

Abstract

The band-edge luminescence properties of 4H-AlN under biaxial and uniaxial stress are studied using the first-principle method. In equilibrium, excitons B and C have energies 92 and 14 meV lower than exciton A, respectively. When the uniaxial tensile strain exceeds ∼0.95%, the top valence band is the B exciton state. Its band-edge emission is no longer prohibited and changes to E⊥c. The shift in the A exciton energy is similar to that of 2H-AlN under stress of −5 to 5 GPa. When the compressive biaxial strain is larger than 5 GPa, the band structure of 4H-AlN becomes indirect.

How to cite this publication

Yingchun Cheng, X. L. Wu, Shuhua Li, Paul Kim Ho Chu (2009). Stress influence on band-edge luminescence properties of 4H-AlN. , 95(12), DOI: https://doi.org/10.1063/1.3232218.

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Publication Details

Type

Article

Year

2009

Authors

4

Datasets

0

Total Files

0

Language

en

DOI

https://doi.org/10.1063/1.3232218

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