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Get Free AccessUsing conducting probe atomic force microscopy (CAFM), we show that electrical conductivity in oligothiophene molecular films deposited on SiO(2)/Si wafers is extremely sensitive to degree of crystalline order in the film. By locally distorting the molecular order in the films through the controlled application of pressure with the AFM tip, the lateral charge transport was reduced by factors varying from 2 to 10, even when no changes in the height of the film could be observed.
Florent Martin, Bas L. M. Hendriksen, Allard J. Katan, Yabing Qi, Clayton Mauldin, Jean Mj Frechet, Miquel Salmerón (2012). Sensitivity to Molecular Order of the Electrical Conductivity in Oligothiophene Monolayer Films. , 29(4), DOI: https://doi.org/10.1021/la303609g.
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Type
Article
Year
2012
Authors
7
Datasets
0
Total Files
0
Language
en
DOI
https://doi.org/10.1021/la303609g
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