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Get Free AccessExtended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Quentin M. Ramasse, Nasim Alem, Alex Zettl, Oleg V. Yazyev, Cheng Pan, Rahul R. Nair, R. Jalil, Recep Zan, U. Bangert, Konstantin ‘kostya’ Novoselov, Ché R. Seabourne, A.J. Scott (2012). Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS. Microscopy and Microanalysis, 18(S2), pp. 1526-1527, DOI: 10.1017/s1431927612009488.
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Type
Article
Year
2012
Authors
12
Datasets
0
Total Files
0
Language
English
Journal
Microscopy and Microanalysis
DOI
10.1017/s1431927612009488
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