Raw Data Library
About
Aims and ScopeAdvisory Board Members
More
Who We Are?
User Guide
Green Science
​
​
EN
Kurumsal BaşvuruSign inGet started
​
​

About
Aims and ScopeAdvisory Board Members
More
Who We Are?
User GuideGreen Science

Language

Kurumsal Başvuru

Sign inGet started
RDL logo

Verified research datasets. Instant access. Built for collaboration.

Navigation

About

Aims and Scope

Advisory Board Members

More

Who We Are?

Contact

Add Raw Data

User Guide

Legal

Privacy Policy

Terms of Service

Support

Got an issue? Email us directly.

Email: info@rawdatalibrary.netOpen Mail App
​
​

© 2026 Raw Data Library. All rights reserved.
PrivacyTermsContact
  1. Raw Data Library
  2. /
  3. Publications
  4. /
  5. Nanoscale ripples on polymers created by a focused ion beam

Verified authors • Institutional access • DOI aware
50,000+ researchers120,000+ datasets90% satisfaction
Article
English
2009

Nanoscale ripples on polymers created by a focused ion beam

0 Datasets

0 Files

English
2009
Nanotechnology
Vol 20 (11)
DOI: 10.1088/0957-4484/20/11/115301

Get instant academic access to this publication’s datasets.

Create free accountHow it works

Frequently asked questions

Is access really free for academics and students?

Yes. After verification, you can browse and download datasets at no cost. Some premium assets may require author approval.

How is my data protected?

Files are stored on encrypted storage. Access is restricted to verified users and all downloads are logged.

Can I request additional materials?

Yes, message the author after sign-up to request supplementary files or replication code.

Advance your research today

Join 50,000+ researchers worldwide. Get instant access to peer-reviewed datasets, advanced analytics, and global collaboration tools.

Get free academic accessLearn more
✓ Immediate verification • ✓ Free institutional access • ✓ Global collaboration
Access Research Data

Join our academic network to download verified datasets and collaborate with researchers worldwide.

Get Free Access
Institutional SSO
Secure
This PDF is not available in different languages.
No localized PDFs are currently available.
John W. Hutchinson
John W. Hutchinson

Harvard University

Verified
Myoung‐Woon Moon
Jun Hyun Han
Ashkan Vaziri
+4 more

Abstract

We show that focused ion beam irradiation results in the creation of peculiar one- and two-dimensional nanoscale features on the surface of polyimide-a common polymer in electronics, large scale structures, and the automobile industry, as well as in biomedical applications. The role of ion beam incident angle, acceleration voltage, and fluence on the morphology of the structural features is systematically investigated, and insights into the mechanisms of formation of these nanoscale features are provided. Moreover, by using the maskless patterning method of the focused ion beam system, we have developed a robust technique for controlled modification of the polymeric surface. The technique, which is analogous to using a gray glass with varying darkness to control the radiation from the sun, but at a much smaller scale, enables the ion intensity and angle to be controlled at each surface point of the polymer, giving rise to structural surface features with desired shape and morphology.

How to cite this publication

Myoung‐Woon Moon, Jun Hyun Han, Ashkan Vaziri, Eun Kyu Her, Kyu Hwan Oh, Kwang‐Ryeol Lee, John W. Hutchinson (2009). Nanoscale ripples on polymers created by a focused ion beam. Nanotechnology, 20(11), pp. 115301-115301, DOI: 10.1088/0957-4484/20/11/115301.

Related publications

Why join Raw Data Library?

Quality

Datasets shared by verified academics with rich metadata and previews.

Control

Authors choose access levels; downloads are logged for transparency.

Free for Academia

Students and faculty get instant access after verification.

Publication Details

Type

Article

Year

2009

Authors

7

Datasets

0

Total Files

0

Language

English

Journal

Nanotechnology

DOI

10.1088/0957-4484/20/11/115301

Join Research Community

Access datasets from 50,000+ researchers worldwide with institutional verification.

Get Free Access