Raw Data Library
About
Aims and ScopeAdvisory Board Members
More
Who We Are?
User Guide
Green Science
​
​
EN
Kurumsal BaşvuruSign inGet started
​
​

About
Aims and ScopeAdvisory Board Members
More
Who We Are?
User GuideGreen Science

Language

Kurumsal Başvuru

Sign inGet started
RDL logo

Verified research datasets. Instant access. Built for collaboration.

Navigation

About

Aims and Scope

Advisory Board Members

More

Who We Are?

Contact

Add Raw Data

User Guide

Legal

Privacy Policy

Terms of Service

Support

Got an issue? Email us directly.

Email: info@rawdatalibrary.netOpen Mail App
​
​

© 2026 Raw Data Library. All rights reserved.
PrivacyTermsContact
  1. Raw Data Library
  2. /
  3. Publications
  4. /
  5. Interface Sensitivity in Electron/Ion Yield X-ray Absorption Spectroscopy: The TiO<sub>2</sub>–H<sub>2</sub>O Interface

Verified authors • Institutional access • DOI aware
50,000+ researchers120,000+ datasets90% satisfaction
Article
en
2021

Interface Sensitivity in Electron/Ion Yield X-ray Absorption Spectroscopy: The TiO<sub>2</sub>–H<sub>2</sub>O Interface

0 Datasets

0 Files

en
2021
Vol 12 (41)
Vol. 12
DOI: 10.1021/acs.jpclett.1c02115

Get instant academic access to this publication’s datasets.

Create free accountHow it works

Frequently asked questions

Is access really free for academics and students?

Yes. After verification, you can browse and download datasets at no cost. Some premium assets may require author approval.

How is my data protected?

Files are stored on encrypted storage. Access is restricted to verified users and all downloads are logged.

Can I request additional materials?

Yes, message the author after sign-up to request supplementary files or replication code.

Advance your research today

Join 50,000+ researchers worldwide. Get instant access to peer-reviewed datasets, advanced analytics, and global collaboration tools.

Get free academic accessLearn more
✓ Immediate verification • ✓ Free institutional access • ✓ Global collaboration
Access Research Data

Join our academic network to download verified datasets and collaborate with researchers worldwide.

Get Free Access
Institutional SSO
Secure
This PDF is not available in different languages.
No localized PDFs are currently available.
Peidong Yang
Peidong Yang

University of California, Berkeley

Verified
M. A. Van Spronsen
Xiao Zhao
Maximilian Jaugstetter
+7 more

Abstract

To understand corrosion, energy storage, (electro)catalysis, etc., obtaining chemical information on the solid-liquid interface is crucial but remains extremely challenging. Here, X-ray absorption spectroscopy (XAS) is used to study the solid-liquid interface between TiO2 and H2O. A thin film (6.7 nm) of TiO2 is deposited on an X-ray-transparent SiNx window, acting as the working electrode in a three-electrode flow cell. The spectra are collected based on the electron emission resulting from the decay of the X-ray-induced core-hole-excited atoms, which we show is sensitive to the solid-liquid interface within a few nm. The drain currents measured at the working and counter electrodes are identical but of opposite sign. With this method, we found that the water layer next to anatase is spectroscopically similar to ice. This result highlights the potential of electron-yield XAS to obtain chemical and structural information with a high sensitivity for the species at the electrode-electrolyte interface.

How to cite this publication

M. A. Van Spronsen, Xiao Zhao, Maximilian Jaugstetter, Carlos Escudero, Tomáš Duchoň, Adrian Hunt, Iradwikanari Waluyo, Peidong Yang, Kristina Tschulik, Miquel Salmerón (2021). Interface Sensitivity in Electron/Ion Yield X-ray Absorption Spectroscopy: The TiO<sub>2</sub>–H<sub>2</sub>O Interface. , 12(41), DOI: https://doi.org/10.1021/acs.jpclett.1c02115.

Related publications

Why join Raw Data Library?

Quality

Datasets shared by verified academics with rich metadata and previews.

Control

Authors choose access levels; downloads are logged for transparency.

Free for Academia

Students and faculty get instant access after verification.

Publication Details

Type

Article

Year

2021

Authors

10

Datasets

0

Total Files

0

Language

en

DOI

https://doi.org/10.1021/acs.jpclett.1c02115

Join Research Community

Access datasets from 50,000+ researchers worldwide with institutional verification.

Get Free Access