0 Datasets
0 Files
Get instant academic access to this publication’s datasets.
Yes. After verification, you can browse and download datasets at no cost. Some premium assets may require author approval.
Files are stored on encrypted storage. Access is restricted to verified users and all downloads are logged.
Yes, message the author after sign-up to request supplementary files or replication code.
Join 50,000+ researchers worldwide. Get instant access to peer-reviewed datasets, advanced analytics, and global collaboration tools.
✓ Immediate verification • ✓ Free institutional access • ✓ Global collaborationJoin our academic network to download verified datasets and collaborate with researchers worldwide.
Get Free AccessExperimental atomic resolution bright and high angle dark field transmission electron microscopy images of mono- and few-layer graphene and boron nitride, as well as of turbostratic arrangements in both materials, are compared to their simulated counterparts. Changes in the images according to defocus, layer number and accelerating voltage are discussed. It emerges that simulations with realistic microscope parameters accurately depict experimental graphene and boron nitride images and present a reliable tool for their interpretation.
Recep Zan, U. Bangert, Quentin M. Ramasse, Konstantin ‘kostya’ Novoselov (2011). Imaging of Bernal stacked and misoriented graphene and boron nitride: experiment and simulation. Journal of Microscopy, 244(2), pp. 152-158, DOI: 10.1111/j.1365-2818.2011.03520.x.
Datasets shared by verified academics with rich metadata and previews.
Authors choose access levels; downloads are logged for transparency.
Students and faculty get instant access after verification.
Type
Article
Year
2011
Authors
4
Datasets
0
Total Files
0
Language
English
Journal
Journal of Microscopy
DOI
10.1111/j.1365-2818.2011.03520.x
Access datasets from 50,000+ researchers worldwide with institutional verification.
Get Free Access
