Raw Data Library
About
Aims and ScopeAdvisory Board Members
More
Who We Are?
User Guide
Green Science
​
​
EN
Sign inGet started
​
​

About
Aims and ScopeAdvisory Board Members
More
Who We Are?
User GuideGreen Science

Language

Sign inGet started
RDL logo

Verified research datasets. Instant access. Built for collaboration.

Navigation

About

Aims and Scope

Advisory Board Members

More

Who We Are?

Add Raw Data

User Guide

Legal

Privacy Policy

Terms of Service

Support

Got an issue? Email us directly.

Email: info@rawdatalibrary.netOpen Mail App
​
​

© 2026 Raw Data Library. All rights reserved.
PrivacyTerms
  1. Raw Data Library
  2. /
  3. Publications
  4. /
  5. High-resolution core-level spectroscopy study of the ultrathin aluminum oxide film on NiAl(110)

Verified authors • Institutional access • DOI aware
50,000+ researchers120,000+ datasets90% satisfaction
Article
English
2011

High-resolution core-level spectroscopy study of the ultrathin aluminum oxide film on NiAl(110)

0 Datasets

0 Files

English
2011
Physical Review B
Vol 83 (12)
DOI: 10.1103/physrevb.83.125417

Get instant academic access to this publication’s datasets.

Create free accountHow it works

Frequently asked questions

Is access really free for academics and students?

Yes. After verification, you can browse and download datasets at no cost. Some premium assets may require author approval.

How is my data protected?

Files are stored on encrypted storage. Access is restricted to verified users and all downloads are logged.

Can I request additional materials?

Yes, message the author after sign-up to request supplementary files or replication code.

Advance your research today

Join 50,000+ researchers worldwide. Get instant access to peer-reviewed datasets, advanced analytics, and global collaboration tools.

Get free academic accessLearn more
✓ Immediate verification • ✓ Free institutional access • ✓ Global collaboration
Access Research Data

Join our academic network to download verified datasets and collaborate with researchers worldwide.

Get Free Access
Institutional SSO
Secure
This PDF is not available in different languages.
No localized PDFs are currently available.
Kresse Georg
Kresse Georg

University of Vienna

Verified
Natalia M. Martin
Jan Knudsen
Sara Blomberg
+8 more

Abstract

We have studied the ultrathin aluminum oxide film on NiAl(110) by a combination of high-resolution core-level spectroscopy and density functional theory calculations. Energy-dependent core-level data from the O 1$s$ and Al 2$p$ levels allows for a distinction between oxygen and aluminum atoms residing at the surface or inside the aluminum oxide film. A comparison to calculated core-level binding energies from the recent model by Kresse et al. [Science 308, 1440 (2005)] reveals good agreement with experiment, and the complex spectroscopic signature of the thin Al oxide on NiAl(110) can be explained. Our assignment of a shifted component in the O $1s$ spectra to oxygen atoms at the surface with a particular Al and oxygen coordination may have implications for the interpretation of photoelectron-diffraction experiments from similar ultrathin aluminum oxide films.

How to cite this publication

Natalia M. Martin, Jan Knudsen, Sara Blomberg, Johan Gustafson, J. N. Andersen, Edvin Lundgren, Hanna Härelind Ingelsten, Per‐Anders Carlsson, Magnus Skoglundh, Andreas Stierle, Kresse Georg (2011). High-resolution core-level spectroscopy study of the ultrathin aluminum oxide film on NiAl(110). Physical Review B, 83(12), DOI: 10.1103/physrevb.83.125417.

Related publications

Why join Raw Data Library?

Quality

Datasets shared by verified academics with rich metadata and previews.

Control

Authors choose access levels; downloads are logged for transparency.

Free for Academia

Students and faculty get instant access after verification.

Publication Details

Type

Article

Year

2011

Authors

11

Datasets

0

Total Files

0

Language

English

Journal

Physical Review B

DOI

10.1103/physrevb.83.125417

Join Research Community

Access datasets from 50,000+ researchers worldwide with institutional verification.

Get Free Access