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Get Free AccessThis paper presents a new hardware optimized and error reduced approximate adder (HOERAA), which is suitable for field programmable gate array (FPGA)- and application specific integrated circuit (ASIC)-based implementations. In this work, we consider a FPGA-based implementation using Xilinx Vivado 2018.3, targeting an Artix-7 FPGA. The ASIC-based realizations are based on a 32/28nm complementary metal oxide semiconductor (CMOS) process. Based on FPGA implementations, we note the following: (i) For 32-bit addition involving a 8-bit least significant inaccurate sub-adder, HOERAA requires 22% fewer look-up tables (LUTs) and 18.6% fewer registers while reducing the minimum clock period by 7.1% and reducing the power-delay product (PDP) by 14.7%, compared to the native accurate FPGA adder, and (ii) for 64-bit addition involving a 8-bit least significant inaccurate sub-adder, HOERAA requires 11% fewer LUTs and 9.3% fewer registers while reducing the minimum clock period by 8.3% and reducing the PDP by 9.3%, compared to the native accurate FPGA adder. Based on ASIC-style implementations, HOERAA is found to achieve the following reductions in design metrics compared to an optimum accurate carry-lookahead adder: (i) A 15.7% reduction in critical path delay, a 21.4% reduction in area, and a 35% reduction in PDP for 32-bit addition involving a 8-bit least significant inaccurate sub-adder, and (ii) a 15.3% reduction in critical path delay, a 10.7% reduction in area, and a 20% reduction in PDP for 64-bit addition involving a 8-bit least significant inaccurate sub-adder. Moreover, comparisons with other approximate adders show that HOERAA has a significantly reduced average error, mean average error, and root mean square error, while reporting near optimum design metrics.
Padmanabhan Balasubramanian, Douglas L. Maskell (2019). Hardware Optimized and Error Reduced Approximate Adder. Electronics, 8(11), pp. 1212-1212, DOI: 10.3390/electronics8111212.
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Type
Article
Year
2019
Authors
2
Datasets
0
Total Files
0
Language
English
Journal
Electronics
DOI
10.3390/electronics8111212
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