Four Dimensional Scanning Transmission Electron Microscopy during the <i>in situ</i> Annealing of a CuZrAl Bulk Metallic Glass

Journal Article Four Dimensional Scanning Transmission Electron Microscopy during the in situ Annealing of a CuZrAl Bulk Metallic Glass Get access Thomas C Pekin, Thomas C Pekin Department of Physics, Humboldt-Universität zu Berlin, Newtonstraße 15, 12489 Berlin, GermanyDepartment of Materials Science & Engineering, University of California, Berkeley, CA 94720, USANational Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA Corresponding author: tcpekin@physik.hu-berlin.de Search for other works by this author on: Oxford Academic Google Scholar Christoph Gammer, Christoph Gammer Erich Schmid Institute of Materials Science, Jahnstraße 12, Leoben, Austria, 8700 Search for other works by this author on: Oxford Academic Google Scholar Colin Ophus, Colin Ophus National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA Search for other works by this author on: Oxford Academic Google Scholar Robert O Ritchie, Robert O Ritchie Department of Materials Science & Engineering, University of California, Berkeley, CA 94720, USAMaterials Sciences Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, USA Search for other works by this author on: Oxford Academic Google Scholar Andrew M Minor Andrew M Minor Department of Materials Science & Engineering, University of California, Berkeley, CA 94720, USANational Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 1470–1471, https://doi.org/10.1017/S1431927619008080 Published: 01 August 2019