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  5. Eliminating Transition Metal Migration and Anionic Redox to Understand Voltage Hysteresis of Lithium‐Rich Layered Oxides

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Article
en
2020

Eliminating Transition Metal Migration and Anionic Redox to Understand Voltage Hysteresis of Lithium‐Rich Layered Oxides

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en
2020
Vol 10 (8)
Vol. 10
DOI: 10.1002/aenm.201903634

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Lin Gu
Lin Gu

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Miao Han
Junyu Jiao
Zepeng Liu
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Abstract

Abstract Lithium‐rich layered oxides are promising candidate cathode materials for the Li‐ion batteries with energy densities above 300 Wh kg −1 . However, issues such as the voltage hysteresis and decay hinder their commercial applications. Due to the entanglement of the transition metal (TM) migration and the anionic redox upon lithium extraction at high potentials, it is difficult to recognize the origin of these issues in conventional Li‐rich layered oxides. Herein, Li 2 MoO 3 is chosen since prototype material to uncover the reason for the voltage hysteresis as the TM migration and anionic redox can be eliminated below 3.6 V versus Li + /Li in this material. On the basis of comprehensive investigations by neutron powder diffraction, scanning transmission electron microscopy, synchrotron X‐ray absorption spectroscopy, and density functional theory calculations, it is clarified that the ordering–disordering transformation of the Mo 3 O 13 clusters induced by the intralayer Mo migration is responsible for the voltage hysteresis in the first cycle; the hysteresis can take place even without the anionic redox or the interlayer Mo migration. A similar suggestion is drawn for its iso‐structured Li 2 RuO 3 ( C 2/ c ). These findings are useful for understanding of the voltage hysteresis in other complicated Li‐rich layered oxides.

How to cite this publication

Miao Han, Junyu Jiao, Zepeng Liu, Xi Shen, Qinghua Zhang, Hong‐Ji Lin, Chien‐Te Chen, Qingyu Kong, Wei Kong Pang, Zhanhu Guo, Richeng Yu, Lin Gu, Zhiwei Hu, Zhaoxiang Wang, Liquan Chen (2020). Eliminating Transition Metal Migration and Anionic Redox to Understand Voltage Hysteresis of Lithium‐Rich Layered Oxides. , 10(8), DOI: https://doi.org/10.1002/aenm.201903634.

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Publication Details

Type

Article

Year

2020

Authors

15

Datasets

0

Total Files

0

Language

en

DOI

https://doi.org/10.1002/aenm.201903634

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