Electronic properties of mechanically induced kinks in single-walled carbon nanotubes

We have used an atomic-force microscope tip to mechanically buckle single-walled carbon nanotubes. The resistance of the induced defects ranged from 10 to 100 kΩ and varied with the local Fermi level, as determined by scanned-gate microscopy. By forming two closely spaced defects on metallic nanotubes, we defined quantum dots less than 100 nm in length. These devices exhibited single-electron charging behavior at temperatures up to ∼165 K.