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  5. Controlled interlayer exciton ionization in an electrostatic trap in atomically thin heterostructures

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Article
en
2024

Controlled interlayer exciton ionization in an electrostatic trap in atomically thin heterostructures

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en
2024
Vol 15 (1)
Vol. 15
DOI: 10.1038/s41467-024-51128-9

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Kenji Watanabe
Kenji Watanabe

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Andrew Y. Joe
Andrés M. Mier Valdivia
Luis A. Jauregui
+13 more

Abstract

Atomically thin semiconductor heterostructures provide a two-dimensional (2D) device platform for creating high densities of cold, controllable excitons. Interlayer excitons (IEs), bound electrons and holes localized to separate 2D quantum well layers, have permanent out-of-plane dipole moments and long lifetimes, allowing their spatial distribution to be tuned on demand. Here, we employ electrostatic gates to trap IEs and control their density. By electrically modulating the IE Stark shift, electron-hole pair concentrations above 2 × 1012 cm-2 can be achieved. At this high IE density, we observe an exponentially increasing linewidth broadening indicative of an IE ionization transition, independent of the trap depth. This runaway threshold remains constant at low temperatures, but increases above 20 K, consistent with the quantum dissociation of a degenerate IE gas. Our demonstration of the IE ionization in a tunable electrostatic trap represents an important step towards the realization of dipolar exciton condensates in solid-state optoelectronic devices.

How to cite this publication

Andrew Y. Joe, Andrés M. Mier Valdivia, Luis A. Jauregui, Kateryna Pistunova, Dapeng Ding, You Zhou, Giovanni Scuri, Kristiaan De Greve, Andrey Sushko, Bumho Kim, Takashi Taniguchi, Kenji Watanabe, James Hone, Mikhail D. Lukin, Hongkun Park, Philip Kim (2024). Controlled interlayer exciton ionization in an electrostatic trap in atomically thin heterostructures. , 15(1), DOI: https://doi.org/10.1038/s41467-024-51128-9.

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Publication Details

Type

Article

Year

2024

Authors

16

Datasets

0

Total Files

0

Language

en

DOI

https://doi.org/10.1038/s41467-024-51128-9

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