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Get Free AccessThis paper presents a technique for characterizing the statistical properties and spectrum of power supply noise using only two on-chip low-throughput samplers. The samplers utilize a voltage-controlled oscillator to perform high-resolution analog-to-digital conversion with minimal hardware. The measurement system is implemented in a 0.13-/spl mu/m process along with a high-speed link transceiver. Measured results from this chip validate the accuracy of the measurement system and elucidate several aspects of power supply noise, including its cyclostationary nature.
E. Alon, Vladimir Stojanović, Mark Horowitz (2005). Circuits and techniques for high-resolution measurement of on-chip power supply noise. IEEE Journal of Solid-State Circuits, 40(4), pp. 820-828, DOI: 10.1109/jssc.2004.842853.
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Type
Article
Year
2005
Authors
3
Datasets
0
Total Files
0
Language
English
Journal
IEEE Journal of Solid-State Circuits
DOI
10.1109/jssc.2004.842853
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